au.\*:("KERN RW")
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OPTICAL INSPECTION OF GROUND METAL SURFACES. = CONTROLE OPTIQUE D'UNE SURFACE DE METAL RECTIFIEEKERN RW.1978; ELECTRO-OPT. SYST. DESIGN; USA; DA. 1978; VOL. 10; NO 7; PP. 20-27; BIBL. 2 REF.Article
DETERMINING OUTER LAYER REGISTRATION VIA A CONCENTRICITY MEASURING MICROSCOPERALPH NJ; KERN RW.1979; ELECTRON. PACKAG. PRODUCT.; USA; DA. 1979; VOL. 19; NO 11; PP. 143-145Article
DEVELOPMENT OF AN AUTOMATIC ELLIPSOMETERBLOEM HH; GOETZ WE; JACKSON RN et al.1980; ELECTRO-OPT. SYST. DESIGN; USA; DA. 1980; VOL. 12; NO 3; PP. 38-45; BIBL. 13 REF.Article